leading in advanced metrology solutions
Semiconductor manufacturers can’t build what they can’t see.
As chips shrink and become 3D, traditional metrology using visible light hits its limits.
At Invisix, we shrink the wavelength of the illumination to extend Moore’s law.
Illuminate
Laser-like, soft x-ray light source with wavelength range matching the device scale leads to information rich signals.
Infer
Reconstruct the detailed 3D structure of advanced devices at high throughput.
Control
Facilitating process control and yield improvement in high volume semiconductor manufacturing.
Metrology solutions for the most challenging 3D problems in next generation device manufacturing.
We develop innovative tools — both hardware and software — for detailed 3D characterization of next generation logic and memory devices, including gate all around transistors.
Key metrics for SXR technology:
years of successful
de-risking
Pending & issued patents
publication citations
highly relevant Nobel Prize in Physics
The Founders
Christina Porter and Sietse van der Post, the co-founders of Invisix, bring deep expertise in soft x-ray metrology. Both have PhDs in physics and over a decade of experience working on this technology. Christina, now CEO, worked for 7 years in SXR project leadership and technical pathfinding at ASML. Sietse, Invisix’s CTO, has shaped the field as lead architect for SXR research at ASML. Together they hold over 25 patents and have been cited more than 1.400 times for their contributions to next-generation measuring systems.
